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Issue DateTitle
2011-Jul

IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 7, page. 967 - 969, 2011-07

Liu, W; Liou, JJ; Kuribara, K; Fukuda, K; Sekitani, T; Someya, T; Chung, J; Jeong, YH; Wang, ZX; Lin, CL

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