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IEEE ELECTRON DEVICE LETTERS, vol. 34, no. 8, page. 1059 - 1061, 2013-08

Rim, T; Kim, K; Kim, S; Baek, CK; Meyyappan, M; Jeong, YH; Lee, JS


ANALYST, vol. 136, no. 23, page. 5012 - 5016, 2011-01

Kim, S; Rim, T; Kim, K; Lee, U; Baek, E; Lee, H; Baek, CK; Meyyappan, M; Deen, MJ; Lee, JS