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Issue DateTitle
2013-Feb

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 48, no. 2, page. 516 - 526, 2013-02

Kim, Jun-Seok; Seo, Young-Hun; Suh, Yunjae; Park, HJSim, JY

2012-Apr

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 47, no. 4, page. 875 - 883, 2012-04

Jee, DW; Seo, YH; Park, HJSim, JY

2012-Mar

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 47, no. 3, page. 736 - 743, 2012-03

Seo, YH; Kim, JS; Park, HJSim, JY

2011-Feb

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 46, no. 2, page. 435 - 444, 2011-02

Young-Sang Kim; Seon-Kyoo Lee; Park, HJSim, JY

2012-May

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 47, no. 5, page. 1165 - 1174, 2012-05

Heesong Seo; Inyoung Choi; Changjoon Park; Jehyung Yoon; Kim, B

2010-Dec

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 45, no. 12, page. 2874 - 2881, 2010-12

Lee, SK; Seo, YH; Park, HJSim, JY

2009-Nov

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 44, no. 11, page. 2891 - 2900, 2009-11

Jung, HK; Lee, K; Kim, JS; Lee, JJ; Sim, JYPARK, HONG JUNE

2013-Feb

IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 48, no. 2, page. 456 - 464, 2013-02

Choi, I; Seo, H; Kim, B

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