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Results 1-10 of 11 (Search time: 0.005 seconds).
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Issue DateTitle
2012-Feb

Japanese Journal of Applied Physics, vol. 51, no. 2, 2012-02

Kim, D; Lee, S; Kim, C; Oh, T; Kang, B

2012-Sep

Microelectronics Reliability, vol. 52, no. 9, page. 1905 - 1908, 2012-09

Lee, S; Kim, D; Kim, C; Lee, NH; Kim, GJ; Lee, C; Park, J; Kang, B

2011-Mar

CONTROL ENGINEERING PRACTICE, vol. 19, no. 3, page. 234 - 242, 2011-03

You, B; Kim, M; Lee, D; Lee, J; Lee, JS

2011-Jul

IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 7, page. 856 - 858, 2011-07

Lee, NH; Baek, D; Kang, B

2011-Jan

ISIJ INTERNATIONAL, vol. 51, no. 2, page. 256 - 261, 2011-01

Kim, M; Moon, S; Na, C; You, B; Kueon, Y; Lee, D; Lee, J; Lee, JS

2011-Aug

JOURNAL OF PROCESS CONTROL, vol. 21, no. 7, page. 1022 - 1029, 2011-08

Kim, M; Moon, S; Na, C; Lee, D; Kueon, Y; Lee, JS

2011-Aug

JOURNAL OF ELECTROMAGNETIC WAVES AND APPLICATIONS, vol. 25, no. 14/15, page. 1930 - 1939, 2011-08

Sung Jin Muhn; Park, WS

2018-Jul

Energies, vol. 11, no. 7, 2018-07

Seo, Minhwan; Goh, Taedong; Park, Minjun; Kim, Sang Woo

2016-Jan

IEEE Transactions on Communications, vol. 64, no. 1, page. 402 - 415, 2016-01

Park, J; Lee, N; Heath, RW

2015-Dec

IEEE Transactions on Microwave Theory and Techniques, vol. 64, page. 106 - 114, 2015-12

Tajima, T; Song, HJ; Yaita, M

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