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Issue DateTitle
2014-Aug

JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 8, page. 10 - 13, 2014-08

Kim, C; Kim, H; Lee, S; Park, J; Kang, B

2012-Mar

JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES, vol. 33, no. 3, page. 333 - 347, 2012-03

Nguyen, TK; Han, H; Park, I

2012-Sep

Microelectronics Reliability, vol. 52, no. 9, page. 1905 - 1908, 2012-09

Lee, S; Kim, D; Kim, C; Lee, NH; Kim, GJ; Lee, C; Park, J; Kang, B

2011-Jun

JOURNAL OF INFRARED MILLIMETER AND TERAHERTZ WAVES, vol. 32, no. 6, page. 763 - 777, 2011-06

Nguyen, TK; Han, H; Park, I

2012-Feb

IEEE ELECTRON DEVICE LETTERS, vol. 33, no. 2, page. 137 - 139, 2012-02

Lee, NH; Kim, H; Kang, B

2011-Jul

IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 7, page. 856 - 858, 2011-07

Lee, NH; Baek, D; Kang, B

2002-Jan

IEEE ELECTRON DEVICE LETTERS, vol. 23, no. 8, page. 479 - 481, 2002-01

Kim, YJ; Choi, KK; Kim, O

1994-Jan

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 341, page. 200 - 204, 1994-01

HAHN, SJ; LEE, JK; PARK, EH; CHUNG, TH

2008-Jan

IEEE TRANSACTIONS ON POWER ELECTRONICS, vol. 23, no. 3, page. 1288 - 1298, 2008-01

Kim, J; Lee, J; Nam, K

2008-Jan

MICROELECTRONIC ENGINEERING, vol. 85, no. 9, page. 1932 - 1936, 2008-01

Kim, YD; Han, SU; Kang, HS; Kang, BK

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