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Issue DateTitle
2011-Aug

JOURNAL OF PROCESS CONTROL, vol. 21, no. 7, page. 1022 - 1029, 2011-08

Kim, M; Moon, S; Na, C; Lee, D; Kueon, Y; Lee, JS

2011-Jul

IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 7, page. 856 - 858, 2011-07

Lee, NH; Baek, D; Kang, B

2011-Mar

CONTROL ENGINEERING PRACTICE, vol. 19, no. 3, page. 234 - 242, 2011-03

You, B; Kim, M; Lee, D; Lee, J; Lee, JS

2011-Jan

ISIJ INTERNATIONAL, vol. 51, no. 2, page. 256 - 261, 2011-01

Kim, M; Moon, S; Na, C; You, B; Kueon, Y; Lee, D; Lee, J; Lee, JS

2004-Jan

CONTRIBUTIONS TO PLASMA PHYSICS, vol. 44, no. 5-6, page. 536 - 541, 2004-01

Yang, SS; Lee, JK; Ko, SW; Kim, HC; Shon, JW

2004-Jan

IEE PROCEEDINGS-ELECTRIC POWER APPLICATIONS, vol. 151, no. 4, page. 385 - 397, 2004-01

Lim, S; Nam, K

2004-Jan

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS, vol. 42, no. 2, page. 164 - 167, 2004-01

Chung, YJ; Lee, JR; Kim, B

2004-Jan

IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 32, no. 1, page. 47 - 53, 2004-01

Lee, JK; Babaeva, NY; Kim, HC; Manuilenko, OV; Shon, JW

2004-Jan

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 51, no. 2, page. 312 - 320, 2004-01

Kim, J; Jung, J; Nam, K

2012-Feb

Japanese Journal of Applied Physics, vol. 51, no. 2, 2012-02

Kim, D; Lee, S; Kim, C; Oh, T; Kang, B

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