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Atom Probe Tomography를 이용한 나노 스케일의 조성분석: Ⅱ.전자소자 및 나노재료에서의 응용

Title
Atom Probe Tomography를 이용한 나노 스케일의 조성분석: Ⅱ.전자소자 및 나노재료에서의 응용
Authors
Woo Young JungChan Woo BangDong Hyun JangGil Ho Gu박찬경
POSTECH Authors
박찬경
Date Issued
Jun-2011
Publisher
한국현미경학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/40278
ISSN
1225-6773
Article Type
Article
Citation
한국현미경학회지, vol. 41, no. 2, page. 89 - 98, 2011-06
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 PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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