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A New Defect Inspection Method for TFT-LCD Panel using Pattern Comparison

Title
A New Defect Inspection Method for TFT-LCD Panel using Pattern Comparison
Authors
Kyong-Min LeeMoon-Soo JangPoo-Gyeon Park
POSTECH Authors
Poo-Gyeon Park
Date Issued
Jun-2008
Publisher
대한전기학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/38740
ISSN
1229-6287
Article Type
Article
Citation
전기학회논문지, 2008-06
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 PARK, POOGYEON
Dept of Electrical Enginrg
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