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Cited 8 time in webofscience Cited 8 time in scopus
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Retention modeling for ultra-thin density of Cu-based conductive bridge random access memory (CBRAM)

Title
Retention modeling for ultra-thin density of Cu-based conductive bridge random access memory (CBRAM)
Authors
Aga, FGWoo, JLee, SSong, JPark, JPark, JLim, SSung, CHwang, H
Date Issued
Feb-2016
Publisher
American Institute of Physics Inc.
URI
http://oasis.postech.ac.kr/handle/2014.oak/37710
ISSN
2158-3226
Article Type
Article
Citation
AIP Advances, 2016-02
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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