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Cited 1 time in webofscience Cited 4 time in scopus
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Improved reset breakdown strength in a HfOx-based resistive memory by introducing RuOx oxygen diffusion barrier

Title
Improved reset breakdown strength in a HfOx-based resistive memory by introducing RuOx oxygen diffusion barrier
Authors
Park, JWoo, JPrakash, ALee, SLim, SHwang, H
Date Issued
May-2016
Publisher
American Institute of Physics Inc.
URI
http://oasis.postech.ac.kr/handle/2014.oak/37700
ISSN
2158-3226
Article Type
Article
Citation
AIP Advances, vol. 6, no. 5, 2016-05
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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