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Effects of High-Pressure Hydrogen Annealing (HPHA) on Reliability Characteristics of RRAM

Title
Effects of High-Pressure Hydrogen Annealing (HPHA) on Reliability Characteristics of RRAM
Authors
Song, JLee, DWoo, JCha, ELee, SHwang, H
POSTECH Authors
Hwang, H
Date Issued
May-2016
Publisher
AMER SCIENTIFIC PUBLISHERS
URI
http://oasis.postech.ac.kr/handle/2014.oak/37699
DOI
10.1166/jnn.2016.12250
ISSN
1533-4880
Article Type
Article
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016-05
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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