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dc.contributor.author김정범ko
dc.contributor.author홍성제ko
dc.contributor.author김종ko
dc.date.available2017-07-18T13:06:52Z-
dc.date.created2009-03-26-
dc.date.issued1997-01-
dc.identifier.citation전자공학회논문지, v.0, no.8, pp.49 - 63-
dc.identifier.issn1226-4873-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/30422-
dc.languageKorean-
dc.publisher대한전자공학회-
dc.titleIDDQ 테스팅을 위한 내장형 전류 감지 회로 설계-
dc.typeArticle-
dc.type.rimsART-
dc.contributor.localauthor홍성제-
dc.contributor.nonIdAuthor김정범-
dc.contributor.nonIdAuthor김종-
dc.citation.endPage63-
dc.citation.number8-
dc.citation.startPage49-
dc.citation.title전자공학회논문지-
dc.citation.volume0-
dc.description.journalClass2-

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