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IDDQ 테스팅을 위한 내장형 전류 감지 회로 설계

Title
IDDQ 테스팅을 위한 내장형 전류 감지 회로 설계
Authors
김정범홍성제김종
POSTECH Authors
홍성제
Date Issued
Jan-1997
Publisher
대한전자공학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/30422
ISSN
1226-4873
Article Type
Article
Citation
전자공학회논문지, vol. 0, no. 8, page. 49 - 63, 1997-01
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 HONG, SUNG JE
Div of IT Convergence Enginrg
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