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Cited 1 time in webofscience Cited 2 time in scopus
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Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer

Title
Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer
Authors
Lee, SHKim, YRHong, JHJeong, EYYoon, JSBaek, CKKim, DWLEE, JEONG SOOJeong, YH
POSTECH Authors
Baek, CKLEE, JEONG SOOJeong, YH
Date Issued
Jul-2014
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/27297
DOI
10.1109/LED.2014.2323255
ISSN
0741-3106
Article Type
Article
Citation
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 7, page. 702 - 704, 2014-07
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 JEONG, YOON HA
Dept of Electrical Enginrg
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