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Cited 6 time in webofscience Cited 6 time in scopus
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Threshold voltage variations due to oblique single grain boundary in sub-50-nm polysilicon channel

Title
Threshold voltage variations due to oblique single grain boundary in sub-50-nm polysilicon channel
Authors
Kim, JRim, TLee, JBaek, CKMeyyappan, MLEE, JEONG SOO
POSTECH Authors
Baek, CKLEE, JEONG SOO
Date Issued
Aug-2014
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/27281
DOI
10.1109/TED.2014.2329848
ISSN
0018-9383
Article Type
Article
Citation
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 61, no. 8, page. 2705 - 2710, 2014-08
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 LEE, JEONG SOO
Dept of Electrical Enginrg
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