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Cited 2 time in webofscience Cited 3 time in scopus
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dc.contributor.authorLee, Sko
dc.contributor.authorSong, Jko
dc.contributor.authorLee, Dko
dc.contributor.authorWoo, Jko
dc.contributor.authorCha, Eko
dc.contributor.authorHwang, Hko
dc.date.available2016-04-01T08:04:07Z-
dc.date.created2015-02-26-
dc.date.issued2015-02-
dc.identifier.citationSOLID-STATE ELECTRONICS, v.104, pp.70 - 74-
dc.identifier.issn0038-1101-
dc.identifier.other2015-OAK-0000032342-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/27182-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherElsevier Limited-
dc.titleEffect of AC pulse overshoot on nonlinearity and reliability of selectorless resistive random access memory in AC pulse operation-
dc.typeArticle-
dc.contributor.college신소재공학과-
dc.identifier.doi10.1016/J.SSE.2014.11.013-
dc.author.googleSangheon Lee-
dc.author.googleJeonghwan Song-
dc.author.googleDaeseok Lee-
dc.author.googleJiyong Woo-
dc.author.googleEuijun Cha-
dc.author.googleHyunsang Hwang-
dc.relation.volume104-
dc.relation.startpage70-
dc.relation.lastpage74-
dc.contributor.id10079928-
dc.relation.journalSOLID-STATE ELECTRONICS-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.contributor.localauthorHwang, H-
dc.contributor.nonIdAuthorLee, S-
dc.contributor.nonIdAuthorSong, J-
dc.contributor.nonIdAuthorLee, D-
dc.contributor.nonIdAuthorWoo, J-
dc.contributor.nonIdAuthorCha, E-
dc.identifier.wosid000349426900012-
dc.date.tcdate2019-02-01-
dc.citation.endPage74-
dc.citation.startPage70-
dc.citation.titleSOLID-STATE ELECTRONICS-
dc.citation.volume104-
dc.identifier.scopusid2-s2.0-84918534843-
dc.description.journalClass1-
dc.description.wostc2-
dc.description.scptc1*
dc.date.scptcdate2018-05-121*

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Dept of Materials Science & Enginrg
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