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Cited 8 time in webofscience Cited 8 time in scopus
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Accelerated Retention Test Method by Controlling Ion Migration Barrier of Resistive Random Access Memory

Title
Accelerated Retention Test Method by Controlling Ion Migration Barrier of Resistive Random Access Memory
Authors
Koo, YAmbrogio, SWoo, JSong, JIelmini, DHwang, H
POSTECH Authors
Hwang, H
Date Issued
Mar-2015
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
URI
http://oasis.postech.ac.kr/handle/2014.oak/26793
DOI
10.1109/LED.2015.2394302
ISSN
0741-3106
Article Type
Article
Citation
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 3, page. 238 - 240, 2015-03
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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