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Real-time radiology in the microscale

Title
Real-time radiology in the microscale
Authors
Hwu, YJe, JHMargaritondo, G
POSTECH Authors
Je, JH
Date Issued
Jan-2005
Publisher
ELSEVIER SCIENCE BV
Abstract
We present several examples of the applications of a novel microradiology approach based on phase contrast enhancement using unmonochromatized synchrotron X-rays. The approach-mostly implemented and realized at the International Consortium on Phase Contrast Imaging and Radiology (ICPCIR) Beamline at the Pohang Light Source in Korea and on the NSRRC B01A wavelength shifter beamline in Hsinchu, Taiwan, allows the real-time analysis of a variety of phenomena on the micron and submicron scale due to the efficient use of the high-synchrotron X-ray intensity and the coherence. The practical examples concern the examination and investigation of microscopic inhomogeneities, local morphology, etc., in materials science, industrial technology, medicine, the life sciences and other areas. (c) 2005 Elsevier B.V. All rights reserved.
Keywords
phase contrast imaging; radiology; broadband synchrotron light; LOCALIZED ELECTROCHEMICAL DEPOSITION; HARD-X-RAYS; SYNCHROTRON-RADIATION; CONTRAST; ELECTRODEPOSITION; MICRORADIOLOGY; TOMOGRAPHY; RESOLUTION; TISSUES; RAT
URI
http://oasis.postech.ac.kr/handle/2014.oak/24362
DOI
10.1016/J.NIMA.2005.07.066
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 551, no. 1, page. 108 - 118, 2005-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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