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White beam Laue topography using a scintillator-CCD combination

Title
White beam Laue topography using a scintillator-CCD combination
Authors
Ji, JMSeol, SKJe, JHArgunova, TSHwu, YTsai, WL
POSTECH Authors
Je, JH
Date Issued
Jan-2005
Publisher
ELSEVIER SCIENCE BV
Keywords
X-ray diffraction; X-ray topography; dislocation; X-RAY TOPOGRAPHY; SILICON; CRYSTALS; CONTRAST; DEFECTS
URI
http://oasis.postech.ac.kr/handle/2014.oak/24361
DOI
10.1016/J.NIMA.2005.
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 551, no. 1, page. 152 - 156, 2005-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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