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Novel X-ray diffraction microscopy technique for measuring textured grains of thin-films

Title
Novel X-ray diffraction microscopy technique for measuring textured grains of thin-films
Authors
Yi, JMJe, JHChu, YSCullen, WGYou, H
POSTECH Authors
Je, JH
Date Issued
Jan-2005
Publisher
ELSEVIER SCIENCE BV
Keywords
X-ray diffraction; X-ray topography; textured grain; COATED CONDUCTORS; MICROSTRUCTURE; DEFORMATION; DIMENSIONS; GROWTH
URI
http://oasis.postech.ac.kr/handle/2014.oak/24360
DOI
10.1016/J.NIMA.2005.
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 551, no. 1, page. 157 - 161, 2005-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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