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Local mean 알고리즘을 이용한 TFT-LCD pad의 결함 검출 시스템

Title
Local mean 알고리즘을 이용한 TFT-LCD pad의 결함 검출 시스템
Authors
이주용
Date Issued
2014
Publisher
포항공과대학교
Abstract
We introduce a method for detecting defects in TFT-LCD images with periodic patterns. We consider single-patterns with one pattern, and multi-patterns that is classi ed into a primary pattern region, a secondary pattern region and boundary region. After each region of the patterns is inspected by calculating a new image that removes periodic patterns and highlights defects, we can estimate the boundary region by least squares estimation. Finally we propose a local mean algorithm to inspect the boundary region. The each result ofinspection is merged into the nal binary image in which the defects are indicated. We focus on increasing speed of simulation to adopt practical system, and results of our methods are promising. We present inspection results on di erent types of images, the proposed method gives more accurate results than existing methods.
URI
http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001673597
http://oasis.postech.ac.kr/handle/2014.oak/2047
Article Type
Thesis
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