Local mean 알고리즘을 이용한 TFT-LCD pad의 결함 검출 시스템
- Local mean 알고리즘을 이용한 TFT-LCD pad의 결함 검출 시스템
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- We introduce a method for detecting defects in TFT-LCD images with periodic patterns. We consider single-patterns with one pattern, and multi-patterns that is classied into a primary pattern region, a secondary pattern region and boundary region. After each regionof the patterns is inspected by calculating a new image that removes periodic patterns and highlights defects, we can estimate the boundary region by least squares estimation. Finally we propose a local mean algorithm to inspect the boundary region. The each result ofinspection is merged into the nal binary image in which the defects are indicated. We focus on increasing speed of simulation to adopt practical system, and results of our methods arepromising. We present inspection results on dierent types of images, the proposed method gives more accurate results than existing methods.
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