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The development and application of imaging EXAFS spectromicroscopy

Title
The development and application of imaging EXAFS spectromicroscopy
Authors
Hwu, YTsai, WLChang, LWChen, CHWu, CCNoh, DYJe, JHFecher, GHBertolo, MBerger, HMargaritondo, G
POSTECH Authors
Je, JH
Date Issued
Jan-1999
Publisher
JAPAN J APPLIED PHYSICS
Keywords
synchrotron spectromicroscopy; EXAFS microscopy; SPECTROSCOPY; OXIDATION
URI
http://oasis.postech.ac.kr/handle/2014.oak/20262
ISSN
0021-4922
Article Type
Article
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, vol. 38, page. 646 - 649, 1999-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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