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Use of photoelectron microscopes as X-ray detectors for imaging and other applications

Title
Use of photoelectron microscopes as X-ray detectors for imaging and other applications
Authors
Hwu, YTsai, WLLai, BMancini, DCJe, JHNoh, DYYoun, HSHwang, CSCerrina, FSwiech, WBertolo, MTromba, GMargaritondo, G
POSTECH Authors
Je, JH
Date Issued
Jan-1999
Publisher
ELSEVIER SCIENCE BV
Keywords
SYNCHROTRON-RADIATION; SPECTROMICROSCOPY; CONTRAST; RESOLUTION; MEPHISTO; SURFACES
URI
http://oasis.postech.ac.kr/handle/2014.oak/20201
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 437, no. 2-3, page. 516 - 520, 1999-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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