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Using photoelectron emission microscopy with hard-X-rays

Title
Using photoelectron emission microscopy with hard-X-rays
Authors
Hwu, YTsai, WLLai, BJe, JHFecher, GHBertolo, MMargaritondo, G
POSTECH Authors
Je, JH
Date Issued
Jan-2001
Publisher
ELSEVIER SCIENCE BV
Keywords
photoelectron emission; X-ray absorption spectroscopy; SYNCHROTRON-RADIATION; THIN-FILMS; SPECTROMICROSCOPY; CONTRAST; RESOLUTION; MEPHISTO; SURFACES; IMAGES
URI
http://oasis.postech.ac.kr/handle/2014.oak/19513
ISSN
0039-6028
Article Type
Article
Citation
SURFACE SCIENCE, vol. 480, no. 3, page. 188 - 195, 2001-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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