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0.3-nm SASE-FEL at PAL

Title
0.3-nm SASE-FEL at PAL
Authors
Oh, JSKim, DEKim, ESPark, SJKang, HSLee, TYKoo, TYChang, SSChung, CWNam, SHNamkung, W
Date Issued
Jan-2004
Publisher
ELSEVIER SCIENCE BV
Keywords
PAL; X-ray SASE; in-vacuum undulator; 0.3 nm; third-harmonic enhancement
URI
http://oasis.postech.ac.kr/handle/2014.oak/17749
DOI
10.1016/J.NIMA.2004.
ISSN
0168-9002
Article Type
Article
Citation
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 528, 1-2, 582, 585
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