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Cited 12 time in webofscience Cited 14 time in scopus
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Highly reliable resistive switching without an initial forming operation by defect engineering

Title
Highly reliable resistive switching without an initial forming operation by defect engineering
Authors
Lee, SLee, DWoo, JCha, EPark, JSong, JMoon, KKoo, YAttari, BTamanna, NHaque, MSHwang, H
POSTECH Authors
Hwang, H
Date Issued
Dec-2013
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
Defect engineering; reliability; resistive switching; retention; MEMORY
URI
http://oasis.postech.ac.kr/handle/2014.oak/14929
DOI
10.1109/LED.2013.2284916
ISSN
0741-3106
Article Type
Article
Citation
IEEE Electron Device Letters, vol. 34, no. 12, page. 1515 - 1517, 2013-12
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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