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Cited 2 time in webofscience Cited 2 time in scopus
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Effect of dynamic stress on off leakage of small-dimension pMOSFETs at high temperature

Title
Effect of dynamic stress on off leakage of small-dimension pMOSFETs at high temperature
Authors
Kim, GJSeo, JHSon, DLee, NHKang, YHwang, YKang, B
POSTECH Authors
Kang, B
Date Issued
Apr-2014
Publisher
IOP PUBLISHING LTD
URI
http://oasis.postech.ac.kr/handle/2014.oak/14294
DOI
10.7567/JJAP.53.04EC06
ISSN
0021-4922
Article Type
Article
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 53, no. 4, 2014-04
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 KANG, BONG KOO
Dept of Electrical Enginrg
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