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Cited 20 time in webofscience Cited 16 time in scopus
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Effects of RESET Current Overshoot and Resistance State on Reliability of RRAM

Title
Effects of RESET Current Overshoot and Resistance State on Reliability of RRAM
Authors
Song, JLee, DWoo, JKoo, YCha, ELee, SPark, JMoon, KMisha, SHPrakash, AHwang, H
POSTECH Authors
Hwang, H
Date Issued
Jun-2014
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
URI
http://oasis.postech.ac.kr/handle/2014.oak/13564
DOI
10.1109/LED.2014.2316544
ISSN
0741-3106
Article Type
Article
Citation
IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 6, page. 636 - 638, 2014-06
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 HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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