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Effects of RESET Current Overshoot and Resistance State on Reliability of RRAM
- Title
- Effects of RESET Current Overshoot and Resistance State on Reliability of RRAM
- Authors
- Song, J; Lee, D; Woo, J; Koo, Y; Cha, E; Lee, S; Park, J; Moon, K; Misha, SH; Prakash, A; Hwang, H
- POSTECH Authors
- Hwang, H
- Date Issued
- Jun-2014
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- ISSN
- 0741-3106
- Article Type
- Article
- Citation
- IEEE ELECTRON DEVICE LETTERS, vol. 35, no. 6, page. 636 - 638, 2014-06
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Related Researcher
- HWANG, HYUNSANG
- Dept of Materials Science & Enginrg