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dc.contributor.authorKwak, JSko
dc.contributor.authorBaik, HKko
dc.contributor.authorKim, Hko
dc.contributor.authorLee, JLko
dc.contributor.authorShin, DWko
dc.contributor.authorPark, CGko
dc.date.available2015-07-07T19:09:53Z-
dc.date.created2009-03-26-
dc.date.issued1996-01-
dc.identifier.citationADVANCED METALLIZATION FOR FUTURE ULSI, v.427, pp.571 - 576-
dc.identifier.issn0886-7860-
dc.identifier.other2015-OAK-0000011792en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/13141-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherMATERIALS RESEARCH SOCIETY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleA microstructural and electrical investigation of Pd/Ge/Ti/Au ohmic contact to n-type GaAs-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.author.googleKwak, JSen_US
dc.author.googleKim, HNen_US
dc.author.googleBaik, HKen_US
dc.author.googleLee, JLen_US
dc.author.googleShin, DWen_US
dc.author.googlePark, CGen_US
dc.author.googleKim, Hen_US
dc.author.googlePyun, KEen_US
dc.relation.volume80en_US
dc.relation.issue7en_US
dc.relation.startpage571en_US
dc.relation.lastpage576en_US
dc.contributor.id10069857en_US
dc.publisher.locationUSen_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.contributor.localauthorPark, CG-
dc.contributor.nonIdAuthorKwak, JS-
dc.contributor.nonIdAuthorBaik, HK-
dc.contributor.nonIdAuthorKim, H-
dc.contributor.nonIdAuthorLee, JL-
dc.contributor.nonIdAuthorShin, DW-
dc.identifier.wosidA1996BG72C00078-
dc.date.tcdate2018-03-23-
dc.citation.endPage576-
dc.citation.startPage571-
dc.citation.titleADVANCED METALLIZATION FOR FUTURE ULSI-
dc.citation.volume427-
dc.identifier.localId0000011792-
dc.identifier.localId0000011792-
dc.description.journalClass1-

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 PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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