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Cited 12 time in webofscience Cited 28 time in scopus
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dc.contributor.authorYun, JPko
dc.contributor.authorChoi, Sko
dc.contributor.authorKim, SWko
dc.date.available2015-06-25T02:54:48Z-
dc.date.created2009-05-19-
dc.date.issued2009-03-
dc.identifier.citationOPTICAL ENGINEERING, v.48, no.3, pp.37205-1 - 37205-19-
dc.identifier.issn0091-3286-
dc.identifier.other2015-OAK-0000016385en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/11867-
dc.description.statementofresponsibilityopenen_US
dc.format.extentpdfen_US
dc.languageEnglish-
dc.publisherSPIE-SOC PHOTOPTICAL INSTRUMENTATION-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleVISION-BASED DEFECT DETECTION OF SCALE-COVERED STEEL BILLET SURFACES-
dc.typeArticle-
dc.contributor.college전자전기공학과en_US
dc.identifier.doi10.1117/1.3102066-
dc.author.googleYun, JPen_US
dc.author.googleChoi, Sen_US
dc.author.googleKim, SWen_US
dc.relation.volume48en_US
dc.relation.issue3en_US
dc.relation.startpage037205-1en_US
dc.relation.lastpage037205-19en_US
dc.contributor.id10055882en_US
dc.publisher.locationUSen_US
dc.relation.journalOPTICAL ENGINEERINGen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.contributor.localauthorKim, SW-
dc.contributor.nonIdAuthorYun, JP-
dc.contributor.nonIdAuthorChoi, S-
dc.identifier.wosid000265641300041-
dc.date.tcdate2019-01-01-
dc.citation.endPage37205-19-
dc.citation.number3-
dc.citation.startPage37205-1-
dc.citation.titleOPTICAL ENGINEERING-
dc.citation.volume48-
dc.identifier.scopusid2-s2.0-77954324178-
dc.description.journalClass1-
dc.description.wostc10-
dc.description.scptc27*
dc.date.scptcdate2018-10-274*

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Dept of Electrical Enginrg
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