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dc.contributor.authorLee, JLko
dc.contributor.authorMun, JKko
dc.contributor.authorLee, BTko
dc.date.available2015-06-25T02:09:25Z-
dc.date.created2009-02-28-
dc.date.issued1997-01-
dc.identifier.citationJOURNAL OF APPLIED PHYSICS, v.82, no.10, pp.5011 - 5016-
dc.identifier.issn0021-8979-
dc.identifier.other2015-OAK-0000009982en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/10466-
dc.description.statementofresponsibilityopenen_US
dc.format.extentpdfen_US
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleThermal degradation mechanism of Ti/Pt/Au Schottky contact to n-type GaAs-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.author.googleLEE, JLen_US
dc.author.googleMUN, JKen_US
dc.author.googleLEE, BTen_US
dc.relation.volume82en_US
dc.relation.issue10en_US
dc.relation.startpage5011en_US
dc.relation.lastpage5016en_US
dc.contributor.id10105416en_US
dc.publisher.locationUSen_US
dc.relation.journalJOURNAL OF APPLIED PHYSICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.contributor.localauthorLee, JL-
dc.contributor.nonIdAuthorMun, JK-
dc.contributor.nonIdAuthorLee, BT-
dc.identifier.wosidA1997YG47300050-
dc.date.tcdate2019-01-01-
dc.citation.endPage5016-
dc.citation.number10-
dc.citation.startPage5011-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume82-
dc.identifier.scopusid2-S2.0-0037626218-
dc.description.journalClass1-
dc.description.wostc11-

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 LEE, JONG LAM
Dept of Materials Science & Enginrg
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