Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM
- Title
- Non-Linear I-V Characteristics of TiOy Film by Optimizing Thickness and Trap Density for Selector-Less ReRAM
- Authors
- Tamanna, N; Misha, SH; Prakash, A; Lee, D; Woo, J; Cha, E; Attarimashalkoubeh, B; Song, J; Lee, S; Moon, K; Hwang, H
- POSTECH Authors
- Hwang, H
- Date Issued
- Jan-2014
- Publisher
- ELECTROCHEMICAL SOC INC
- URI
- http://oasis.postech.ac.kr/handle/2014.oak/10090
- DOI
- 10.1149/2.0021410SSL
- ISSN
- 2162-8742
- Article Type
- Article
- Citation
- ECS SOLID STATE LETTERS, vol. 3, no. 10, page. P117 - P119, 2014-01
- Files in This Item:
-
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.