Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node

Title
Power, Performance and Area Analysis of Source/Drain Patterning n/p FinFETs based 6T-SRAM cell for 3-nm technology node
Authors
BAEK, ROCK HYUNLEE, JUNJONGSEUNGHWAN, LEEJINSU, JEONGYOON, JUN SIK
Date Issued
14-Feb-2020
Publisher
제 27회 반도체학술대회
URI
http://oasis.postech.ac.kr/handle/2014.oak/100684
Article Type
Conference
Citation
제 27회 반도체학술대회, 2020-02-14
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

 BAEK, ROCK HYUN
Dept of Electrical Enginrg
Read more

Views & Downloads

Browse