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Issue DateTitle
1996-Jan

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 43, no. 4, page. 519 - 526, 1996-01

Lee, JL; Mun, JK; Kim, H; Lee, JJ; Park, HM

1998-Jan

IEEE ELECTRON DEVICE LETTERS, vol. 19, no. 7, page. 250 - 252, 1998-01

Lee, JL; Kim, H; Mun, JK; Maeng, SJ

1998-Jan

SOLID-STATE ELECTRONICS, vol. 42, no. 11, page. 2063 - 2068, 1998-01

Lee, JL; Mun, JK; Kim, H

1998-Jan

MICROELECTRONICS RELIABILITY, vol. 38, no. 1, page. 171 - 178, 1998-01

Mun, JK; Lee, JL; Kim, H; Lee, BT; Lee, JJ; Pyun, KE

2002-Jan

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 20, no. 1, page. 274 - 277, 2002-01

Choi, KJ; Lee, JL; Mun, JK; Kim, H

2003-Jan

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 21, no. 5, page. 2133 - 2137, 2003-01

Han, SY; Choi, KJ; Lee, JL; Mun, JK; Park, M; Kim, H

1997-Jan

APPLIED PHYSICS LETTERS, vol. 71, no. 18, page. 2656 - 2658, 1997-01

Kim, YT; Lee, JL; Mun, JK; Kim, H

1997-Jan

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 30, 1997-01

Maeng, SJ; Mun, JK; Kim, MG; Lee, JJ; Lee, JL

1997-Jan

JOURNAL OF APPLIED PHYSICS, vol. 82, no. 10, page. 5011 - 5016, 1997-01

Lee, JL; Mun, JK; Lee, BT

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