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Issue Date	Title
2012-Feb	3차원 원자탐침 전자현미경을 이용한 Si 기판에 패터닝 된 Fin 구조 내 도핑 원소분석 제19회 한국반도체학술대회, 2012-02-15 박찬경; 김보화; 박성민; 구길호
2008-Nov	Atomic Structure and Composition at the Interface of Epitaxial CoSi2 on Si (001) The 9th Asia-Pacific Microscopy Conference, 2008-11-04 박찬경; 구길호; 이한보람; 김형준
2008-Aug	Cobalt Atomic Layer Deposition for Nanoscale Contact Applications 1st International Conference on Microelectronics and Plasma Technology, 2008-08-01 박찬경; 이한보람; 구길호; 손종역; 김형준
2012-Feb	Combined Analyses of STEM and APT for Nano-scale Phase Identification in Advanced Materials and Devices. APMC 2012, 2012-02-05 박찬경; 박형석; 구길호; 설재복
2012-Feb	Dimensional Analyses of Dopants in Fin Structure By using Atom Probe Tomography APMC 2012, 2012-02-05 박찬경; 김보화; 구길호
2009-Oct	Direct synthesis of silicon nanocrystals on the gas phase using non thermal plasma and effect of the nitrogen plasma on optical property of the silicon nanocrytals structures 대한재료금속학회 추계학술대회, 2009-10-22 박찬경; 장동현; 구길호
2009-Oct	Effect of In-composition Fluctuation on Luminescence Efficiency of InGaN Based LED 대한재료금속학회 추계학술대회, 2009-10-22 박찬경; 김보화; 구길호
2009-Apr	Effects of Al on Microstructure and Phase Transformation Behavior in TRIP Steels 대한재료금속학회 춘계학술대회, 2009-04-23 박찬경; 구길호
2011-Sep	Effects of growth condition on the structural and compositional fluctuation of multiquantum well (MQWs) in blue LED FEMMS 2011, 2011-09-22 박찬경; 장동현; 구길호
2011-Oct	Effects of Growth Pressure on the Structural and Composition Fluctuation of Multi Quantum Wells(MQWs) in Blue LED 대한금속재료학회 추계학술대회, 2011-10-27 박찬경; 장동현; 구길호
2009-Nov	Effects of Impurity Controlled Mo Under-layer on Reliability of Cu interconnector for TFT-LCD MRS fall meeting, 2009-11-30 박찬경; 구길호
2012-May	Effects of strain control layer on the electrical and optical properties in InGaN based LEDs IFES 2012, 2012-05-21 박찬경; 구길호
2012	Effects of Structural and Compositional Characteristics on the Electrical and Optical Properties of InGaN/GaN Multi Quantum Wells Thesis(Doctor), 2012 구길호
2008-Jun	Enhanced Reliability of Cu Interconnector by using Impurity-Contolled Mo layer T he 51st International Field Emission Symposium(IFES), 2008-06-25 박찬경; 구길호; 서주형
2012-May	Extension of the Transition Layer at the Vertical Interface of Si/SiO2 observed in Atom Probe Tomography IFES 2012, 2012-05-21 박찬경; 이지현; 구길호
2011-Oct	In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films IEEE NMDC 2011, 2011-10-19 오상호; 신가영; 이호녕; 구길호; 임지성
2011-May	In-situ TEM Probing of Ferroelectric Domain Switching 5th Congress of the International Union of Microbeam Analysis Societies, 2011-05-25 오상호; 신가영; 이호녕; 구길호
2011-Feb	In-situ TEM Probing of Ferroelectric Domain Switching in (Pb,Zr)TiO3 Thin Films 제 18회 한국반도체학술대회, 2011-02-18 오상호; 신가영; 구길호; 임지성; 이호녕
2011-Jul	Indium composition fluctuation in InGaN well layer of LED devices analyzed by 9th International Conference on Nitride Semiconductor, 2011-07-10 박찬경; 구길호; 이봉호
2011-May	Indium composition fluctuation in InGaN well layer of LED devices analyzed by APT and STEM-EELS 5th Congress of the International Union of Microbeam Analysis Societies(IUMAS-V), 2011-05-22 박찬경; 구길호; 이봉호

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