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IEEE ELECTRON DEVICE LETTERS, vol. 34, no. 9, page. 1082 - 1084, 2013-09

Majumdar, K; S. Vivekanand; C. Huffman; K. Matthews; Matthews, K; C. H. Chen; Chen, CH; Baek, RH; M. RODGERS; Rodgers, M; S. GAUSEPOHL; Gausepohl, S; Kang, CY; P. D. Kirsch; Kirsch, PD