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IEEE International Reliability Physics Symposium (IRPS), page. 1.1 - 1.4, 2011-04-10

김재준; D. Ioannou; K. Zhao; A. Bansal; B. Linder; R. Bolam; E. Cartier; R. Rao; G. La Rosa; G. Massey; M. Hauser; K. Das; J. Stathis; J. Aitken; D. Badami; S. Mittl